Code | Type | Head of UE | Department’s contact details | Teacher(s) |
---|---|---|---|---|
US-M1-SCCHIM-020-M | Compulsory UE | LAZZARONI Roberto | S817 - Chimie des matériaux nouveaux |
Language of instruction | Language of assessment | HT(*) | HTPE(*) | HTPS(*) | HR(*) | HD(*) | Credits | Weighting | Term |
---|---|---|---|---|---|---|---|---|---|
Français | 0 | 0 | 0 | 0 | 0 | 3 | 3 |
AA Code | Teaching Activity (AA) | HT(*) | HTPE(*) | HTPS(*) | HR(*) | HD(*) | Term | |
---|---|---|---|---|---|---|---|---|
S-CHIM-047 |
Objectives of general skills
- In the field of chemistry, possess highly specialised and integrated knowledge and a wide range of skills adding to those covered in the Bachelor's programme in chemistry.
- Help lead and complete a major development project, individually or in teams, related to chemistry.
- Mobilise, articulate and promote the knowledge and skills acquired.
- Demonstrate independence and their ability to work alone or in teams.
- Manage research, development and innovation within chemistry and/or its applications.
- Mobilise their knowledge effectively, identify their limits, conduct methodical research and critically analyse scientifically valid information.
- Communicate clearly in the scientific domain.
- Communicate, both orally and in writing, their findings, original proposals, knowledge and underlying principles, in a clear, structured and justified manner.
- Develop and integrate a high degree of autonomy.
- Pursue their education and gain additional knowledge and new skills.
- Apply high quality scientific methodology.
- Demonstrate thoroughness, independence, creativity, intellectual honesty, and ethical values.
UE's Learning outcomes
To acquire the theoretical and experimental concepts of scanning probe microscopies in terms of : (i) imaging, (ii) mapping of properties, and (iii) nanolithography and to get acquainted with the practical application of these concepts
UE Content
- Scanning tunneling microscopy o General principles o Applications o Scanning tunneling spectroscopy - Atomic force microscopy o General presentation o Operation modes o Force curves o Experimental aspects - Other scanning force microscopies o Electrostatic force microscopy and derived techniques o Magnetic force microscopy - Scanning optical microscopies - Surface modifications with a local probe o Electrochemical nanolithography o Mechanically-induced modifications o Dip-pen lithography
Prior experience
Not applicable
Term 1 for Integrated Assessment - type
- N/A
Term 1 for Integrated Assessment - comments
Not applicable
Term 2 for Integrated Assessment - type
- Presentation and works
Term 2 for Integrated Assessment - comments
Not applicable
Term 3 for Integrated Assessment - type
- Presentation and works
Term 3 for Integrated Assessment - comments
Not applicable
Resit Assessment for IT - Term 1 (B1BA1) - Comments
Not applicable
Type of Teaching Activity/Activities
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S-CHIM-047 |
Mode of delivery
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S-CHIM-047 |
Required Reading
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S-CHIM-047 |
Required Learning Resources/Tools
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S-CHIM-047 |
Recommended Reading
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S-CHIM-047 |
Recommended Learning Resources/Tools
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S-CHIM-047 |
Other Recommended Reading
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S-CHIM-047 |