| Code | Lecturer(s) | Associate Lecturer(s) | Subsitute Lecturer(s) et other(s) |
|---|---|---|---|
| S-CHIM-047 |
|
| Language of instruction | Language of assessment | HT(*) | HTPE(*) | HTPS(*) | HR(*) | HD(*) | Term |
|---|---|---|---|---|---|---|---|
| Français | Français | 15 | 0 | 15 | 0 | 0 | Q2 |
Contents
- Scanning tunneling microscopy o General principles o Applications o Scanning tunneling spectroscopy - Atomic force microscopy o General presentation o Operation modes o Force curves o Experimental aspects - Other scanning force microscopies o Electrostatic force microscopy and derived techniques o Magnetic force microscopy - Scanning optical microscopies - Surface modifications with a local probe o Electrochemical nanolithography o Mechanically-induced modifications o Dip-pen lithography
Required Learning Resources/Tools
Not applicable
Recommended Learning Resources/Tools
Not applicable
Other Recommended Reading
Not applicable
Mode of delivery
- Face to face
Term 1 Assessment - type
- N/A
Term 1 Assessment - comments
Not applicable
Term 2 Assessment - type
- Presentation and works
Term 2 Assessment - comments
Not applicable
Term 3 Assessment - type
- Presentation and works
Term 3 Assessment - comments
Not applicable
Resit Assessment - Term 1 (B1BA1) - Comments
Not applicable
Type of Teaching Activity/Activities
- Cours (cours magistraux; conférences)
- Préparations, travaux, recherches d'information