Study programmeFrançais
Scanning Probe Microscopy
Programme component of Master's Degree in Physics Research Focus à la Faculty of Science
CodeTypeHead of UE Department’s
contact details
Teacher(s)
US-M2-PHYSFA-027-MOptional UELAZZARONI RobertoS817 - Chimie des matériaux nouveaux
  • LAZZARONI Roberto

Language
of instruction
Language
of assessment
HT(*) HTPE(*) HTPS(*) HR(*) HD(*) CreditsWeighting Term
  • Français
Français15015003.00100.00

AA CodeTeaching Activity (AA) HT(*) HTPE(*) HTPS(*) HR(*) HD(*) Term Weighting
S-CHIM-047Scanning Probe Microscopy1501500Q2100.00%
Unité d'enseignement

Objectives of Programme's Learning Outcomes

  • Master expertise.
    • Have developed the knowledge and skills acquired in the previous cycle to a level that extends beyond the Bachelor's course in Physics, and which provides the basis for the development and implementation of original ideas in a professional context.
    • Have reached a level of knowledge and skill giving them access to the third cycle of the study programme / doctoral studies (only for two-year Master courses).
  • Provide clear and accurate information.
    • Share their knowledge and findings clearly and back them up rationally to specialist and non-specialist audiences.
  • Grow personally and professionally.
    • Have developed the skills that will enable them to continue to acquire knowledge independently.
  • Have a creative and rigorous scientific approach
    • Gather and interpret relevant scientific data and critically analyse it, distinguising working hypotheses of proven facts.
    • Apply their knowledge, understanding and ability to solve problems in new or unfamiliar environments and in multidisciplinary contexts related to physical sciences.
  • Master expertise.
    • Have developed the knowledge and skills acquired in the previous cycle to a level that extends beyond the Bachelor's course in Physics, and which provides the basis for the development and implementation of original ideas in a professional context.
    • Have reached a level of knowledge and skill giving them access to the third cycle of the study prgramme / doctoral studies (only for two-year Master courses).
  • Provide clear and accurate information.
    • Share their knowledge and findings clearly and back them up rationally to specialist and non-specialist audiences.

Learning Outcomes of UE

To acquire the theoretical and experimental concepts of scanning probe microscopies in terms of : (i) imaging, (ii) mapping of properties, and (iii) nanolithography and to get acquainted with the practical application of these concepts

Content of UE

• - Scanning tunneling microscopy • o General principles • o Applications • o Scanning tunneling spectroscopy • - Atomic force microscopy • o General presentation • o Operation modes • o Force curves • o Experimental aspects • - Other scanning force microscopies • o Electrostatic force microscopy and derived techniques • o Magnetic force microscopy • - Scanning optical microscopies • - Surface modifications with a local probe • o Electrochemical nanolithography • o Mechanically-induced modifications • o Dip-pen lithography

Prior Experience

Not applicable

Type of Assessment for UE in Q1

  • N/A

Q1 UE Assessment Comments

Not applicable

Type of Assessment for UE in Q2

  • Presentation and works

Q2 UE Assessment Comments

Not applicable

Type of Assessment for UE in Q3

  • Presentation and works

Q3 UE Assessment Comments

Not applicable

Q1 UE Resit Assessment Comments (BAB1)

Not applicable

Type of Teaching Activity/Activities

AAType of Teaching Activity/Activities
S-CHIM-047
  • Cours magistraux
  • Préparations, travaux, recherches d'information

Mode of delivery

AAMode of delivery
S-CHIM-047
  • Face to face

Required Reading

AA
S-CHIM-047

Required Learning Resources/Tools

AARequired Learning Resources/Tools
S-CHIM-047Not applicable

Recommended Reading

AA
S-CHIM-047

Recommended Learning Resources/Tools

AARecommended Learning Resources/Tools
S-CHIM-047Not applicable

Other Recommended Reading

AAOther Recommended Reading
S-CHIM-047Not applicable

Grade Deferrals of AAs from one year to the next

AAGrade Deferrals of AAs from one year to the next
S-CHIM-047Autorisé
Date de génération : 17/03/2017
20, place du Parc, B7000 Mons - Belgique
Tél: +32 (0)65 373111
Courriel: info.mons@umons.ac.be