 | Study programme | Français | |
 | Techniques for Microstructural Characterization | ||
Activité d'apprentissage à la Faculty of Engineering |
| Code | Lecturer(s) | Associate Lecturer(s) | Subsitute Lecturer(s) et other(s) |
|---|---|---|---|
| I-SDMA-005 |
|
| Language of instruction | Language of assessment | HT(*) | HTPE(*) | HTPS(*) | HR(*) | HD(*) | Term |
|---|---|---|---|---|---|---|---|
| Français | Français | 12 | 12 | 0 | 0 | 0 | Q2 |
Content of Learning Activity
Interaction between radiations and mater; scanning electron microscopy (SEM); elemental analysis (EDX and WDX); spectroscopic techniques (AES, XPS, SIMS); transmission electron microscopy (TEM); X ray diffraction (XRD).
Required Learning Resources/Tools
Not applicable
Recommended Learning Resources/Tools
Sans objet
Other Recommended Reading
Not applicable
Mode of delivery
- Face to face
Type of Teaching Activity/Activities
- Cours magistraux
- Exercices dirigés
- Travaux de laboratoire
Evaluations
The assessment methods of the Learning Activity (AA) are specified in the course description of the corresponding Educational Component (UE)
Unité d’enseignement de la combinaison linguistique