Code | Lecturer(s) | Associate Lecturer(s) | Subsitute Lecturer(s) et other(s) |
---|---|---|---|
I-SDMA-005 |
|
Language of instruction | Language of assessment | HT(*) | HTPE(*) | HTPS(*) | HR(*) | HD(*) | Term |
---|---|---|---|---|---|---|---|
Français | Français | 6 | 6 | 0 | 0 | 0 | Q2 |
Contents
Interaction between radiations and mater; scanning electron microscopy (SEM); elemental analysis (EDX and WDX); spectroscopic techniques (AES, XPS, SIMS); transmission electron microscopy (TEM); X ray diffraction (XRD).
Required Learning Resources/Tools
Not applicable
Recommended Learning Resources/Tools
Sans objet
Other Recommended Reading
Not applicable
Mode of delivery
- Face to face
Term 1 Assessment - type
- N/A
Term 1 Assessment - comments
Not applicable
Term 2 Assessment - type
- Presentation and works
- Oral Examination
- Quoted exercices
Term 2 Assessment - comments
Oral examination to be validated. If oral examination validated, final mark = 50% of oral examination, 30% quoted exercises and 20% of labs and visits reports.
Term 3 Assessment - type
- Presentation and works
- Oral examination
- Quoted exercices
Term 3 Assessment - comments
Oral examination to be validated. If oral examination validated, final mark = 50% of oral examination, 30% quoted exercises and 20% of labs and visits reports.
Resit Assessment - Term 1 (B1BA1) - Comments
Not applicable
Type of Teaching Activity/Activities
- Cours (cours magistraux; conférences)
- Exercices dirigés / utilisation de logiciels / démonstrations
- Travaux pratiques / travaux de laboratoire / exercices de création et recherche en atelier / projet sur ordinateur /études de cas