 | Study programme 2020-2021 | Français | |
| Scanning Probe Microscopy | |||
Learning Activity |
| Code | Lecturer(s) | Associate Lecturer(s) | Subsitute Lecturer(s) et other(s) | Establishment |
|---|---|---|---|---|
| S-CHIM-047 |
|
|
| Language of instruction | Language of assessment | HT(*) | HTPE(*) | HTPS(*) | HR(*) | HD(*) | Term |
|---|---|---|---|---|---|---|---|
| Français | Français | 15 | 0 | 15 | 0 | 0 | Q2 |
Content of Learning Activity
- Scanning tunneling microscopy o General principles o Applications o Scanning tunneling spectroscopy - Atomic force microscopy o General presentation o Operation modes o Force curves o Experimental aspects - Other scanning force microscopies o Electrostatic force microscopy and derived techniques o Magnetic force microscopy - Scanning optical microscopies - Surface modifications with a local probe o Electrochemical nanolithography o Mechanically-induced modifications o Dip-pen lithography
Required Learning Resources/Tools
Not applicable
Recommended Learning Resources/Tools
Not applicable
Other Recommended Reading
Not applicable
Mode of delivery
- Face to face
Type of Teaching Activity/Activities
- Cours magistraux
- Préparations, travaux, recherches d'information
Evaluations
The assessment methods of the Learning Activity (AA) are specified in the course description of the corresponding Educational Component (UE)